Formation and Characterization of Transversely Modulated Nanostructures in Metallic Thin Films Using Epitaxial Control

Title of Document: FORMATION AND CHARACTERIZATION OF TRANSVERSELY MODULATED NANOSTRUCTURES IN METALLIC THIN FILMS USING EPITAXIAL CONTROL Brad Michael Boyerinas, Ph.D, 2013 Directed By: Hugh A. Bruck, Professor, Department of Mechanical Engineering This thesis describes a fundamental investigation into the formation, characterization, and modeling of epitaxially-controlled self-assembly at the nanoscale. The presence of coherent nanophases and the clamping effect from an epitaxial substrate enables the formation of transversely modulated nanostructures (TMNS) resulting in improved functionality, which was previously observed through increased piezoelectric response in BiFeO3. The ability to fabricate high quality epitaxial films presents opportunity to investigate coherent phase decomposition in other material systems with multifunctional response. The research herein aims to extend the concept of nanoscale self assembly in metallic systems, including Ag-Si and Pd-PdH. First, the effect of annealing a Ag-Si couple was examined, and ordered, nanoscale Ag crystallites were observed along the interface with the epitaxial Si wafer. It is demonstrated that Ag foil can be used in place of doped Ag paste (commonly used in solar cell metallization) to achieve TMNS at the interface. It was proved that annealing the Ag-Si couple in air is necessary for the self-assembly reaction to take place, as doing so prevents bulk diffusion and eutectic melting. Electron backscatter diffraction was used to verify the epitaxial relation between the Ag nanostructures and Si crystal.